4.7 (671) In stock
Rectification Mechanism of a P-type Oxide-based Metal–Insulator–Oxide Semiconductor–Metal Thin-Film Diode
Energy band diagram of a metal insulator semiconductor (MIS) structure.
Figure 3 from Charge Trapping Memory Characteristics of Amorphous
Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
Molecules, Free Full-Text
Effect of the doping concentration of the top semiconductor
Role of defects on the transparent conducting properties of binary
Micromachines, Free Full-Text
Sensors, Free Full-Text
The O 1s spectra of Al2O3. XPS O 1s peak in Al2O3 made with (a
High-performance oxide thin-film diode and its conduction
A Metal–Insulator Transition of the Buried MnO2 Monolayer in Complex Oxide Heterostructure - Liu - 2016 - Advanced Materials - Wiley Online Library
Catalysts, Free Full-Text
Ion-gating analysis on conduction mechanisms in oxide
High-performance oxide thin-film diode and its conduction
